outline

The latest generation of X-ray fluorescence analysis microscope XGT-7000 has ushered in a new era of scientific analysis. It perfectly combines optical imaging with elemental analysis, providing new analytical methods for researchers' research and analysis.

The SDD detector ensures high-speed and high-precision scanning of elemental surfaces; High energy resolution, high counting rate measurement, and no need for liquid nitrogen.

The dual vacuum design ensures that users can switch between the atmosphere inside the sample chamber (atmospheric or vacuum) within seconds. Even when measuring aqueous and biological samples, high sensitivity can be ensured for measuring all elements.

The unique hardware design ensures the flexibility of XGT-7000 operation and a wide range of applications. By controlling the X-ray catheter through software to switch between 10 μ m and 1.2 mm, the optimal measurement conditions are ensured, from microscopic to macroscopic.

A CCD camera coaxial with the X-ray catheter can quickly and accurately locate the area of interest.

·Single point and multi-point automatic analysis

The single point and automatic multi-point analysis functions enable high-quality spectrograms to be obtained from a single analysis location or a user-defined series of locations. Automatically annotate element spectral peaks. Quantitative calculation using basic parameter method, single standard basic parameter method, or standard sample calibration curve method, with a minimum measurable content at the ppm level. The film thickness analysis software can analyze the multi-layer film thickness of samples at the nm or μ m level.

·Hyperspectral surface scanning

SmartMap software collects elemental spectra at each pixel point. After the collection is completed, users can add or delete a certain element surface distribution map based on their own analysis, achieving offline analysis of existing data.

X-ray transmission images are beneficial for users to observe the internal structure of the sample, achieving true non-destructive internal observation.

features

The XGT-7200, with its many innovations, has a wide range of applications in various fields such as electronics and electrical appliances, engine wear analysis, forensic science, geology and minerals, medicine, museums, metallurgy, biology, etc. The flexible design of XGT-7200 ensures that users can obtain high-quality analysis results through simple operations, whether it is analyzing large areas, micro area details, or simultaneously acquiring X-ray fluorescence images and X-ray transmission images.

*The highest spatial resolution

HORIBA's unique X-ray tube technology provides high spatial resolution micro area XRF analysis, with X-ray spot diameters as small as 10 micrometers. This highest intensity ultrafine spot can perform rapid and non-destructive microstructure analysis.

*X-ray transmission image

The function of simultaneously collecting XRF images and X-ray transmission images can be used to analyze the internal structure and elemental composition of samples that cannot be observed by the naked eye. By using an ultrafine vertical X-ray beam, clear internal images can be obtained even when observing uneven samples.

*Dual vacuum mode

Unique dual vacuum mode design - switching between each other can be completed within seconds.

In full vacuum mode, the entire sample chamber is in a vacuum atmosphere to ensure high sensitivity for light element analysis.

Partial vacuum mode, where the sample is in an atmospheric atmosphere, is suitable for analyzing water containing samples such as biological tissues, cultural relics fragments, and museum collections.

*Complete analysis of the entire sample

*Operating software for integrating data collection and analysis

The user-friendly operating software allows users to easily control hardware, select measurement areas, and perform full data analysis. The functions include: automatic peak calibration, qualitative and quantitative measurement, RGB image synthesis, line analysis, etc. The large sample chamber makes it possible to analyze the entire sample, and with a 10 micron beam spot, it is possible to analyze small areas and even measure areas as large as 10cm x 10cm.

Technical parameters:

Measurement elements:

Na~U

X-ray tube:

Rhodium (Rh) target/tube voltage 50 kV/tube current 1 mA

X-ray fluorescence detector:

SDD silicon drift detector

Through X-ray detector:

NaI (Ti) crystal

X-ray catheter:

Single capillary tube 10 μ m/100 μ m without filter

Optical image:

Overall optical image and coaxial magnified image of the sample

Sample table size:

XY: 100mm × 100mm

Sample warehouse:

Full vacuum mode/maximum vacuum 300mm × 300mm × 80mm

Signal processing:

Numerical Pulse Processor (INCA Processor)

Qualitative analysis:

Automatic definition of spectral peaks/KLM line annotation/spectral peak search/spectral peak matching

Quantitative analysis:

Basic parameter method without standard samples/Basic parameter method without standard samples/Basic parameter method for matching standard files/Calibration curve/Basic parameter method for multi-layer film/Multi point analysis (up to 5000)/Multi point result output to Excel ®

Surface scanning function:

Through X-ray imaging/elemental distribution map/spectral scanning/rectangular scanning/spectral generation/RGB synthesis/ruler/line analysis

Other functions:

XGT-5200 operating software can be opened simultaneously